【 product description 】

* Wafer-level electrical and optical testers: various light-emitting / detection devices combined with manual / semi-automatic probe systems
Realize high-speed automatic measurement: It has perfect connection with semi-automatic detection system.
* Equipped with a specially designed optical measurement mechanism M-Scope according to the measurement parameters required by the optical equipment.
* Combine various optical series of Synos ​​to build various wafer-level measurement systems.
* Equipped with Optometrics version of Synos' optical measurement and analysis software.
＊ A semi-automatic probe station control is installed, and the Synos ​​optical system acquires photoelectric analysis data collection and management.
* Various functions such as various measurement systems, sample data management, and measurement methods.
* Both mass production and non-mass measurement are possible.
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【 products characteristics 】

Analysis of various light-emitting elements
＊ I-V-L characteristics
＊ Beam mode (NFP, FFP)
＊ Center wavelength of light
＊ Rf modulation characteristics, etc.

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